Yervant Zorian is an American electrical engineer known for his work on Integrated circuit testing. He is an IEEE Fellow for contributions to built-in self-test of complex devices and systems since 1999.^[1] Zorian won the 2005 Hans Karlsson Award^[2] and is a Chief Architect and Fellow at Synopsys.^[3] Zorian is also the President of Synopsys Armenia.^[3]

Zorian is a recipient of numerous awards.

• 2000 recipient of the IEEE Distinguished Services Award for outstanding leadership of TTTC including General Chair, Activities Group Chair, and Editor-in-Chief for Design and Test Magazine ^[4]
• 2005 recipient of the IEEE Circuits and Systems Society Industrial Pioneer Award for his contributions to design for test technology through Built-In Self-Test solutions and design tools that dramatically boosted the quality and reliability of digital systems and the efficiency of design and test engineers ^[5]
• 2006 recipient of the IEEE Hans Karlsson Standards Award for outstanding leadership, communications, and achievement with the IEEE Testability Method for Embedded Core-based ICs standard (IEEE Std. 1500tm-2005) ^[6]
• IEEE Meritorious Award
• 2013 recipient of the Republic of Armenia's National Medal of Science for his research on “Test Solutions for Nanoscale Systems-on-Chip: Algorithms, Methods and Test Infrastructure”^[7]